Manufacturer Part NumberSN74BCT8374ADWRE4
Manufacturer / BrandTexas Instruments
Available Quantity80700 Pieces
Unit PriceQuote by Email ([email protected])
Brife DescriptionIC SCAN TEST DEVICE W/FF 24-SOIC
Product CategoryLogic - Specialty Logic
Lead Free Status / RoHS StatusLead free / RoHS Compliant
Moisture Sensitivity Level (MSL) 1 (Unlimited)
Delivery Time1-2 Days
Date Code (D/C)New
Datasheet Download SN74BCT8374ADWRE4.pdf

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Part Number
SN74BCT8374ADWRE4
Production Status (Lifecycle)
Contact us
Manufacturer Lead time
6-8 weeks
Condition
New & Unused, Original Sealed
Shipping way
DHL / FEDEX / UPS / TNT / EMS / Normal Post
Part Status
Obsolete
Logic Type
Scan Test Device with D-Type Edge-Triggered Flip-Flops
Supply Voltage
4.5 V ~ 5.5 V
Number of Bits
8
Operating Temperature
0°C ~ 70°C
Mounting Type
Surface Mount
Package / Case
24-SOIC (0.295", 7.50mm Width)
Supplier Device Package
24-SOIC
Weight
Contact us
Application
Email for details
Replacement Part
SN74BCT8374ADWRE4

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