DEV Schnittstelle - spezialisiert
| Optoelectronics | Sensors, Transducers | Integrated Circuits (ICs) | RF/IF and RFID |
|---|---|---|---|
| Artikelnummer | Hersteller / Marke | Kurze Beschreibung |
|---|---|---|
| Texas Instruments | IC ABT SCAN TEST DEV 3.3V 64LQFP | |
| Texas Instruments | IC ABT SCAN TEST DEV 3.3V 64LQFP | |
| Texas Instruments | IC INTERFACE MICRWIRE DEV 28PLCC | |
| Texas Instruments | IC INTERFACE MICRWIRE DEV 28PLCC | |
| Texas Instruments | IC INTERFACE MICRWIRE DEV 28PLCC |
