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Texas Instruments |
IC Regulators BUFFER 13-26BIT 56-VQFN |
Active | Registered Buffer with SSTL_2 Compatible I/O for DDR | 2.3 V ~ 2.7 V | 13, 26 | 0°C ~ 70°C | Surface Mount | 56-VFQFN Exposed Pad | 56-VQFN (8x8) |
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Texas Instruments |
IC Regulators BUFF 26BIT SSTL 56-VQFN |
Active | Registered Buffer with SSTL_2 Compatible I/O for DDR | 2.3 V ~ 2.7 V | 13, 26 | 0°C ~ 70°C | Surface Mount | 56-VFQFN Exposed Pad | 56-VQFN (8x8) |
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Texas Instruments |
IC Regulators BUFFER 13-26BIT 64-TSSOP |
Active | Registered Buffer with SSTL_2 Compatible I/O for DDR | 2.3 V ~ 2.7 V | 13, 26 | 0°C ~ 70°C | Surface Mount | 64-TFSOP (0.240", 6.10mm Width) | 64-TSSOP |
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Texas Instruments |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
Active | ABT Scan Test Device With Universal Bus Transceivers | 2.7 V ~ 3.6 V | 20 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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Texas Instruments |
IC Regulators TXRX LVTTL-GTLP 48-TSSOP |
Active | LVTTL-TO-GTLP Adjustable-Edge-Rate Registered Transceiver | 3.15 V ~ 3.45 V | 8 | -40°C ~ 85°C | Surface Mount | 48-TFSOP (0.240", 6.10mm Width) | 48-TSSOP |
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Texas Instruments |
IC Regulators XCVR LVTTL-GTLP 48-TSSOP |
Active | LVTTL-TO-GTLP Adjustable-Edge-Rate Registered Transceiver | 3.15 V ~ 3.45 V | 8 | -40°C ~ 85°C | Surface Mount | 48-TFSOP (0.240", 6.10mm Width) | 48-TSSOP |
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Texas Instruments |
IC SCAN-TEST-DEV/XCVR 64-TSSOP |
Active | ABT Scan Test Device With Universal Bus Transceivers | 2.7 V ~ 3.6 V | 18 | -40°C ~ 85°C | Surface Mount | 64-TFSOP (0.240", 6.10mm Width) | 64-TSSOP |
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Texas Instruments |
IC REGSTR BUFFER 28-56BIT 176BGA |
Active | 1:2 Registered Buffer with Parity | 1.25V, 1.35V, 1.5V | 28, 56 | - | Surface Mount | 176-TFBGA | 176-NFBGA (13.5x8) |
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Texas Instruments |
IC REGSTR BUFFER 28-56BIT 176BGA |
Active | 1:2 Registered Buffer with Parity | - | 28, 56 | 0°C ~ 85°C | Surface Mount | 176-TFBGA | 176-NFBGA (13.5x8) |
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Texas Instruments |
IC REGSTR BUFF 28-56BIT 176NFBGA |
Active | 1:2 Registered Buffer with Parity | 1.25V, 1.35V, 1.5V | 28, 56 | 0°C ~ 85°C | Surface Mount | 176-TFBGA | 176-NFBGA (13.5x8) |
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Texas Instruments |
IC 20BIT SCAN TST DEV UBT 64LQFP |
Active | ABT Scan Test Device With Universal Bus Transceivers | 2.7 V ~ 3.6 V | 20 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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Texas Instruments |
IC 18BIT SCAN TST DEV UBT 64LQFP |
Active | ABT Scan Test Device With Universal Bus Transceivers | 2.7 V ~ 3.6 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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Texas Instruments |
IC SCAN-TEST-DEV/TRANSCVR 64LQFP |
Active | ABT Scan Test Device With Universal Bus Transceivers | 2.7 V ~ 3.6 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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Texas Instruments |
IC CONFIG Regulators BUFF 25BIT 96-BGA |
Active | 1:1, 1:2 Configurable Registered Buffer with Parity | 1.7 V ~ 1.9 V | 25, 14 | -40°C ~ 85°C | Surface Mount | 96-LFBGA | 96-PBGA MICROSTAR (13.6x5.6) |
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Texas Instruments |
IC SCAN-TEST-DEV/XCVR 28-SSOP |
Active | Scan Test Device with Bus Transceiver and Registers | 4.5 V ~ 5.5 V | 8 | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP |
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Texas Instruments |
IC SCAN-TEST-DEV/XCVR 28-SOIC |
Active | Scan Test Device with Bus Transceiver and Registers | 4.5 V ~ 5.5 V | 8 | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC |
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Texas Instruments |
IC SCAN-TEST-DEV/TXRX 56-SSOP |
Active | Scan Test Device with Bus Transceivers | 4.5 V ~ 5.5 V | 18 | -40°C ~ 85°C | Surface Mount | 56-BSSOP (0.295", 7.50mm Width) | 56-SSOP |
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Texas Instruments |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
Active | ABT Scan Test Device With Universal Bus Transceivers | 2.7 V ~ 3.6 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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Texas Instruments |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
Active | ABT Scan Test Device With Universal Bus Transceivers | 2.7 V ~ 3.6 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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Texas Instruments |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
Active | ABT Scan Test Device With Universal Bus Transceivers | 2.7 V ~ 3.6 V | 20 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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Texas Instruments |
IC SCAN-TEST-DEV/TXRX 56-TSSOP |
Active | Scan Test Device with Bus Transceivers | 4.5 V ~ 5.5 V | 18 | -40°C ~ 85°C | Surface Mount | 56-TFSOP (0.240", 6.10mm Width) | 56-TSSOP |
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Texas Instruments |
IC 10-BIT SCAN PORT XCVR 24TSSOP |
Active | Addressable Scan Ports | 2.7 V ~ 3.6 V | 10 | -40°C ~ 85°C | Surface Mount | 24-TSSOP (0.173", 4.40mm Width) | 24-TSSOP |
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Texas Instruments |
IC BUFF CONFIG Regulators 25BIT 96BGA |
Active | Configurable Buffer with Address-Parity Test | 1.425 V ~ 1.575 V | 25 | -40°C ~ 85°C | Surface Mount | 96-LFBGA | 96-PBGA (13.6x5.6) |
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Texas Instruments |
IC CONFIG Regulators BUFFER 25BIT 96BGA |
Active | 1:1, 1:2 Configurable Registered Buffer with Parity | 1.7 V ~ 1.9 V | 25, 14 | -40°C ~ 85°C | Surface Mount | 96-LFBGA | 96-PBGA (13.6x5.6) |
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Texas Instruments |
IC CONFIG Regulators BUFF 25BIT 96-BGA |
Active | 1:1, 1:2 Configurable Registered Buffer | 1.7 V ~ 1.9 V | 25, 14 | 0°C ~ 70°C | Surface Mount | 96-LFBGA | 96-PBGA MICROSTAR (13.6x5.6) |
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Texas Instruments |
IC CONFIG Regulators BUFF 25BIT 96-BGA |
Active | 1:1, 1:2 Configurable Registered Buffer with Parity | 1.7 V ~ 1.9 V | 25, 14 | -40°C ~ 85°C | Surface Mount | 96-LFBGA | 96-PBGA MICROSTAR (13.6x5.6) |
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Texas Instruments |
IC CONFIG Regulators BUFF 25BIT 96-BGA |
Active | 1:1, 1:2 Configurable Registered Buffer | 1.7 V ~ 1.9 V | 25, 14 | -40°C ~ 85°C | Surface Mount | 96-LFBGA | 96-PBGA MICROSTAR (13.6x5.6) |
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Texas Instruments |
IC INCIDENT-WAVE XCVR 48-TSSOP |
Active | Incident-Wave Switching Bus Transceivers | 4.5 V ~ 5.5 V | 11 | -40°C ~ 85°C | Surface Mount | 48-TFSOP (0.240", 6.10mm Width) | 48-TSSOP |
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Texas Instruments |
IC 25BIT CONFIG Regulators BUFF 96-BGA |
Obsolete | 1:1, 1:2 Configurable Registered Buffer | 1.7 V ~ 1.9 V | 25, 14 | 0°C ~ 70°C | Surface Mount | 96-LFBGA | 96-PBGA MICROSTAR (13.6x5.6) |
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Texas Instruments |
IC BUFFER 24BIT-48BIT 114LFBGA |
Active | Registered Buffer with SSTL_2 Compatible I/O for DDR | 2.3 V ~ 2.7 V | 24, 48 | -40°C ~ 85°C (TA) | Surface Mount | 114-LFBGA | 114-BGA MICROSTAR (16x5.5) |
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Texas Instruments |
IC LINK ADDRSS SCAN-PORT 64-LQFP |
Active | Linking Addressable Scan Ports | 2.7 V ~ 3.6 V | - | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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Texas Instruments |
IC SCAN TEST DEV/TXRX 28-SOIC |
Active | Scan Test Device with Registered Bus Transceiver | 4.5 V ~ 5.5 V | 8 | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC |
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Texas Instruments |
IC SCAN-TEST-DEV/TXRX 56-SSOP |
Active | Scan Test Device with Inverting Bus Transceivers | 4.5 V ~ 5.5 V | 18 | -40°C ~ 85°C | Surface Mount | 56-BSSOP (0.295", 7.50mm Width) | 56-SSOP |
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Texas Instruments |
IC SCAN-TEST-DEV/XCVR 28-SSOP |
Active | Scan Test Device with Bus Transceiver and Registers | 4.5 V ~ 5.5 V | 8 | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP |
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Texas Instruments |
IC EMBEDDED TEST BUS CTRL 24SOIC |
Active | Embedded Test-Bus Controllers | 2.7 V ~ 3.6 V | 8 | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC 11-BIT I-WS BUS TXRX 48-SSOP |
Active | Incident-Wave Switching Bus Transceivers | 4.5 V ~ 5.5 V | 11 | -40°C ~ 85°C | Surface Mount | 48-BSSOP (0.295", 7.50mm Width) | 48-SSOP |
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Texas Instruments |
IC 25BIT CONFIG Regulators BUFF 96-BGA |
Active | 1:1, 1:2 Configurable Registered Buffer | 1.7 V ~ 1.9 V | 25, 14 | 0°C ~ 70°C | Surface Mount | 96-LFBGA | 96-PBGA MICROSTAR (13.6x5.6) |
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Texas Instruments |
IC 10B ADDRSBL SCAN PORT 24TSSOP |
Active | Addressable Scan Ports | 2.7 V ~ 3.6 V | 10 | -40°C ~ 85°C | Surface Mount | 24-TSSOP (0.173", 4.40mm Width) | 24-TSSOP |
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Texas Instruments |
IC CONFIG Regulators BUFF 28BIT 176-BGA |
Active | 1:2 Configurable Registered Buffer with Parity | 1.7 V ~ 1.9 V | 28 | -40°C ~ 85°C | Surface Mount | 176-BGA | 176-NFBGA (6x15) |
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Texas Instruments |
IC 25BIT CONFIG Regulators BUFF 96-BGA |
Active | 1:1, 1:2 Configurable Registered Buffer | 1.7 V ~ 1.9 V | 25, 14 | 0°C ~ 70°C | Surface Mount | 96-LFBGA | 96-PBGA MICROSTAR (13.6x5.6) |
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Texas Instruments |
IC REGSTR BUFF 28-56BIT 160NFBGA |
Active | 1:2 Registered Buffer with Parity | 1.7 V ~ 1.9 V | 28 | -40°C ~ 85°C | Surface Mount | 160-TFBGA | 160-NFBGA (9x13) |
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Texas Instruments |
IC REGSTR BUFFER 28-56BIT 176BGA |
Active | 1:2 Configurable Registered Buffer with Parity | 1.7 V ~ 1.9 V | 28 | -40°C ~ 85°C | Surface Mount | 176-BGA | 176-NFBGA (6x15) |
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Texas Instruments |
IC RGSTRD BUFF 24-48BIT 114BGA |
Active | Registered Buffer with SSTL_2 Compatible I/O for DDR | 2.3 V ~ 2.7 V | 24, 48 | 0°C ~ 70°C | Surface Mount | 114-LFBGA | 114-BGA MICROSTAR (16x5.5) |
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Texas Instruments |
IC SCAN-TEST-DEV/TXRX 64-LQFP |
Active | Scan Test Device with Universal Bus Transceivers | 4.5 V ~ 5.5 V | 20 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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Texas Instruments |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
Active | ABT Scan Test Device With Transceivers and Registers | 2.7 V ~ 3.6 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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Texas Instruments |
IC SCAN TEST DEVICE ABT 64-LQFP |
Active | ABT Scan Test Device With Transceivers and Registers | 2.7 V ~ 3.6 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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Texas Instruments |
IC TXRX/Regulators 18BIT 3.3V 64-LQFP |
Active | ABT Scan Test Device With Transceivers and Registers | 2.7 V ~ 3.6 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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Renesas Electronics America Inc. |
IC COMP DRVR/WINDOW 18V 72-QFN |
Active | Comparator, Driver | 9 V ~ 18 V | 4 | -40°C ~ 85°C | Surface Mount | 72-VFQFN Exposed Pad | 72-QFN (10x10) |
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Texas Instruments |
IC SCAN-TEST-DEV/TXRX 64-LQFP |
Active | Scan Test Device With Transceivers And Registers | 4.5 V ~ 5.5 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
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Texas Instruments |
IC SCAN-TEST-DEV/TXRX 64-LQFP |
Active | Scan Test Device With Transceivers And Registers | 4.5 V ~ 5.5 V | 18 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |